NANOVEA Profilometer is a 3D, non-contact, optical profiler designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilometers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
With a single profilometer scan, a wide range of measurements can be obtained such as 3D waviness, roughness, step height and/or film thickness to advanced fractal analysis and microstructure/particle characterization.
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