Perfect amount of information in one video. Keep grinding buddy!

Thanks

Hi how XPS measures the surface composition by formula, which means under the peak ratio I know the software can do it, I want to know the formula. thank you

@MarcelButschle

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Hey, apologies for the late reply. I am not 100% sure but think it should be something like this: At%_i = (A_i/RSF_i / ∑(A_j/RSF_j for all j)) * 100% At%_i: atomic percentage of element i A_i: the peak area (or intensity) of element i RSF_i: the relative sensitivity factor for element i Explanation: When we look at the data from the XPS instrument, we see different peaks for the different elements. Each peak at corresponds to a different element. The number of electrons detected (the height of the peak) tells us how much of that element is present in the material. However, not all elements respond to XPS in the same way. Some elements naturally produce stronger signals (higher peaks) than others, even if they're present in the same amounts. That's where the relative sensitivity factor (RSF) comes in. The RSF is a correction factor that accounts for these differences. By dividing the raw signal (the initial height of the peak) by the RSF for that element, we can get a more accurate picture of how much of each element is actually present. Finally, we normalize the data. This means we adjust the numbers so they add up to 100%. This is useful because it allows us to express the composition of the material in terms of percentages, which are often easier to understand and compare.