X-Ray Analysis in the SEM: Part 3 "Matrix Correction Procedures"

Ғылым және технология

Ron Rasch from the Centre for Microscopy & Microanalysis at the University of Queensland, provides an introduction to analysing the elemental composition of samples. Topics include: X-ray production, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), spectral artefacts and an introduction to matrix correction effects (ZAF). This video is Part 3 of the series of 4 videos.

Пікірлер: 2

  • @MarsW1321
    @MarsW132111 ай бұрын

    I worked in a EDS company. This is by far the best presentation I've seen about EDS analysis. Most importantly, it's based on practical experience that you need to know or be aware of in the analysis. Also, it's not quite easy to put all the sessions into one hour talk. Good job and thank you for the presentation.

  • @MicroscopyAustralia

    @MicroscopyAustralia

    11 ай бұрын

    Thank you :)

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