SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope

SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features.
That means you can observe what you want to observe in more detail, more easily, and more quickly.
Consequently, SPM-Nanoa microscopes provide powerful assistance for everything from observing the topography of micro areas to measuring their physical properties.
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SPM-Nanoa is a trademark of Shimadzu Corporation or its affiliated companies in Japan and/or other countries.
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