Image contrast in Scanning Electron Microscopy (SEM)

Experimental Techniques in Materials Characterization, Lecture # 08
Image contrast in Scanning Electron Microscopy (SEM)
"Experimental Techniques in Materials Characterization" is a special course designed for the M.Phil. and PhD researchers working in the field of Materials Science, Nanotechnology, Physics, Chemistry and Materials Engineering, etc. In this course, the researchers will learn about the popular materials characterization techniques like SEM, TEM,EDX, XPS and XRD etc.
In the current lecture we will have a discussion on:
#Image Contrast in SEM
#Image Contrast
#SE Images - Topographic Contrast
#BSE Image - Atomic Number Contrast
#Field Contrast
#Voltage contrast
#Magnetic Field Contrast
#CL micrographs of Te-doped GaAs
#EBIC Image of Doping Variations in GaAs Wafer

Пікірлер: 1

  • @HamzaKhan-nt3ds
    @HamzaKhan-nt3ds Жыл бұрын

    Good👍